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2024-12-04News｜U.S. BIS Adds 140 Companies to Entity List
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2024-11-22News｜iSTART-TEK Demonstrates Customers’ Successful Mass Production at ICCAD
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2024-10-23News｜Reconfigurable Memory Test Algorithm Architecture
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2024-10-16News｜iSTART-TEK’s EDA tool, START™ v3, Supports eFuse from Renowned Semiconductor Manufacturers and OTP and MTP from Leading NVM IP Suppliers
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2024-09-27News｜Extend Chip Lifecycle with iSTART-TEK’s EZ-Monitor IP
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2024-09-25News | iSTART-TEK’s eFlash Testing and Repair IP are Widely applied in Automotive Electronic Chips
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2024-09-10News | iSTART-TEK has successfully obtained the Chinese patent for “Memory Repair Circuit, Memory Module, and Memory Repair Method”
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2024-09-06News｜Balance Chip Costs and Quality
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2024-08-20News｜iSTART-TEK’s Memory Repair Technology Becomes a Key Player in the AI Era
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2024-08-07News｜The Rise of AI Applications: iSTART-TEK’s Memory Testing and Repair Technology Boosts Yield
Events
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2024-09-26Webinar｜Extend Chip Lifecycle with EZ-Monitor IP
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2024-09-20Webinar｜Memory Repair Based on Patented Architecture
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2024-08-08ICCAD-Expo 2024
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2024-07-17Webinar｜Easily Change SRAM Testing Algorithms After Mass Production Using IP
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2024-05-29Webinar｜UDA: Modular Architecture SRAM Testing Algorithm Development Environment