iStart ClassMultimedia Library Episode 23: Make MBIST Much Easier with EZ-TEC IP https://youtu.be/3DrgHip5bxM EZ-TEC IP: Componentizing Algorithms to Enhance Testing Efficiency EZ-TEC (Easy Test Element Change IP)…ZoeJune 25, 2024
iStart ClassMultimedia Library Episode 22: The Importance of Using Licensed EDA software https://youtu.be/6av5LKvz61A Why should we use licensed EDA software? Using licensed EDA software provides not only…ZoeMay 28, 2024
iStart Class Episode 18: iSTART-TEK ASIC Design Services About iSTART-TEK iSTART-TEK is a company that specially provides automatic memory test & repair EDA…ZoeApril 25, 2024
iStart Class Episode 17: Memory testing algorithms tailored for CIM applications The trend of CIM Computing in Memory (CIM) is a trend in computer architecture aimed…ZoeApril 15, 2024
iStart Class Episode 16: The algorithm specifically used to detect memory errors caused by high temperature High temperature cause memory errors During memory testing, thermal noise generated by high temperatures can…ZoeApril 9, 2024
iStart Class Episode 15: eFlash BIST IP About eFlash BIST IP eFlash BIST provides test items that meet automotive electronic requirements, encompassing…ZoeMarch 22, 2024
iStart Class Episode 14: EZ-Safety & EZ-TEC (Detailed) What's the scoop with EZ-Safety? EZ-Safety SRAM IP is our charm for automotive chips, tailored…ZoeMarch 6, 2024
iStart Class Episode 13: Algorithms Specifically Designed for Different Faults Part 2 How to Detect Faults iSTART-TEK offers a variety of memory testing algorithms, including the most…ZoeFebruary 19, 2024
iStart Class Episode 12: Algorithms Specifically Designed for Different Faults Part 1 Customized Test Algorithms iSTART-TEK has successfully obtained the U.S. patent for "METHOD FOR GENERATING A…ZoeJanuary 31, 2024