eFlash BIST IP
eFlash Test and Repair Solution
iSTART-TEK’s BIST can realize all eFlash testing items, covering UMC’s 40nm and 55nm processes, as well as SST’s 0.11um and 0.18um processes, and customized embedded eFlash IP wafer software testing and final testing. The BIST from iSTART-TEK features a flexible serial interface, reducing the need for IC test pins and increasing testing flexibility. All testing functions can be individually activated or deactivated, and it provides a diagnostic mode to test memory defect addresses. Additionally, iSTART-TEK’s BISR can record the addresses of eFlash faults and use redundancy features to replace faulty eFlash, thereby improving the yield of eFlash chip products.
Features
- Support generating ATE STIL/WGL format
- Implement all recommendation test items for high test coverage
- All test item can be configurable
- Timing parameters can be adjusted
- Provide users with repairing mode to increase yield
- Diagnosis mode
Applications
- Automotive
- Security
- White goods
- MCU
- IoT
- Smartcards
- Wearables
- Gaming
Interface
- JTAG
- IEEE 1149.7
- SPI