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2026-06-22AI Chip Yield Becomes a Key Competitive Factor — iSTART-TEK Captures New Opportunities with Memory Quality Management Technology
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2026-06-11DDI Functional Upgrades Drive SRAM Capacity Growth, Increasing the Importance of MBIST and MBISR
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2026-06-01Jensen Huang Highlights the Arrival of the AI Factory Era; iSTART-TEK Expands High-Reliability Chip Testing Opportunities
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2026-06-01Huawei’s “Tao Law” Sparks a New Advanced Packaging Race — iSTART-TEK Has Already Positioned Itself with IEEE 1838
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2026-05-07Using AI to Solve AI Challenges! AI Computing Drives Memory Complexity Growth, Making Smarter MBIST Algorithms Essential
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2026-04-23iSTART-TEK Memory Test and Repair Technologies Enable Mass Production Across Diverse Chip Applications, Surpassing 300 Million Units Shipped
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2026-04-08iSTART-TEK’s “Memory Test Algorithm Recommendation System” Secures Utility Model Patent, Redefining SoC Test Development Workflow
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2026-03-17[Industry Trend] The New Frontier of AI Inference: SRAM is the Key to Performance—Are You Ready?
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2026-03-04iSTART-TEK to Launch a Comprehensive DFT Solution to Enhance Testability and Mass Production Quality of Advanced Chips
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2026-02-24[Industry Trend] SRAM Repair Emerging as a Critical Growth Driver Under the AI Wave
Events
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2026-04-17AEIF 2026｜The 13th Automotive Electronic Innovation Conference 2026
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2025-07-22ICCAD-Expo 2025｜Cheng-yu IC 2025 Annual Developemt Forum& the 31th IC Design Industry Expo
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2025-01-20Webinar｜iSTART-TEK’s APPA
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2025-01-07Webinar｜START™ v5 Supports the BIST of CIM
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2025-01-06Webinar｜How to Integrate iSTART-TEK’s EDA Tools with Other EDA Tools to Complete the DFT Flows
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2024-12-30Webinar｜How to Control DPPM Through EZ-BIST