NVM IP Configurable Testing and Repairing Platform
The NVM configurable testing and repairing platform features multiple NVM IP models (EZ-NBIST), such as ReRAM (RRAM), eFlash, OTP, MTP, etc. This platform can be utilized in applications that incorporate NVM IP.
NVM IP (EZ-NBIST) accelerates the time required to complete the designs of testing and repair electric circuit.
In addition, it provides customers with high efficiency testing and repair solutions, particularly for supporting advanced testing algorithms for ReRAM.
Features
- Multiple embedded NVM IP models (OTP, MTP, eFlash, MRAM, ReRAM)
- Advanced testing algorithms for MRAM and ReRAM
- Friendly GUI interface
- Advanced testing and repairing architecture
Application
- Automotive
- Security
- White goods
- MCU
- IoT
- Smartcards
- Wearables
- Gaming
Testing Interface
- JTAG
- SPI