News & Events

AI Chip Yield Becomes a Key Competitive Factor — iSTART-TEK Captures New Opportunities with Memory Quality Management Technology

DDI Functional Upgrades Drive SRAM Capacity Growth, Increasing the Importance of MBIST and MBISR

Jensen Huang Highlights the Arrival of the AI Factory Era; iSTART-TEK Expands High-Reliability Chip Testing Opportunities

Huawei’s “Tao Law” Sparks a New Advanced Packaging Race — iSTART-TEK Has Already Positioned Itself with IEEE 1838

Using AI to Solve AI Challenges! AI Computing Drives Memory Complexity Growth, Making Smarter MBIST Algorithms Essential

iSTART-TEK Memory Test and Repair Technologies Enable Mass Production Across Diverse Chip Applications, Surpassing 300 Million Units Shipped

iSTART-TEK’s “Memory Test Algorithm Recommendation System” Secures Utility Model Patent, Redefining SoC Test Development Workflow

[Industry Trend] The New Frontier of AI Inference: SRAM is the Key to Performance—Are You Ready?

iSTART-TEK to Launch a Comprehensive DFT Solution to Enhance Testability and Mass Production Quality of Advanced Chips

[Industry Trend] SRAM Repair Emerging as a Critical Growth Driver Under the AI Wave