EZ-Debug Usage and Purchase Methods
In traditional IC testing, especially for MBIST testing, the use of ATE (Automatic Test Equipment) machines is often required, which incurs additional costs and time. However, by utilizing EZ-Debug, we can quickly and effectively perform MBIST testing, particularly during the IC trial production or low-volume production phase. The operation is very convenient; users can directly use their personal computers to conduct MBIST testing with simple operations, eliminating the complicated steps of using ATE machines. This not only simplifies the testing process but also significantly reduces related costs. If you wish to purchase EZ-Debug, you can contact iSTART-TEK’s sales team to initiate the procurement process.
Diagnosis Usage and Advantages
Diagnosis is primarily used to analyze memory failures. Through this diagnostic feature, failure-related information can be obtained, such as which algorithm detected the failure, the operation used, or identifying the erroneous address and data, etc. This enables developers to analyze the diagnosis information and provide feedback to the wafer manufacturer, thereby improving yield rates.