iSTART iReport January 2024 – Easily obtain the latest technologies and event information of iSTART-TEK.
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Patent
● iSTART-TEK Obtains U.S. Patent “METHOD FOR GENERATINGAN MEMORY BUILT-IN SELF-TEST ALGORITHM CIRCUIT”
News
● iSTART-TEK Targets Automotive Electronics with Customized EDA Tools
White Paper
● Highly Configurable RRAM IP Testing and Repairing Circuits Development Environment: EZ-NBIST
iSTART Class
● iSTART Class Episode 1: BIST & BISR
● iSTART Class Episode 2: Testing Algorithms
● iSTART Class Episode 3: EZ-Debug
● iSTART Class Episode 4: iSTART-TEK Technical Service
● iSTART Class Episode 5: START & EZ-BIST
● iSTART Class Episode 6: Customer Testimonial -iTE
● iSTART Class Episode 7: Customer Testimonial -Rafael Micro
● iSTART Class Episode 8: Specific functions for Automotive and HPC
● iSTART Class Episode 9: Preview new products and functions: EZ-Safety & EZ-TEC