iReport-2024-Vol.1.1 專刊，讓您可迅速獲取 iSTART-TEK的最新技術與活動訊息。
全文請點選“詳細內容”
專利Patent
● 芯測科技「METHOD FOR GENERATINGAN MEMORY BUILT-IN SELF-TEST ALGORITHM CIRCUIT 」成功取得美國專利證書
新聞News
● 芯測科技客製化EDA工具結合雲端與AI搶攻車用電子商機
技術文章White Paper
● Highly configurable RRAM IP testing and repairing circuits development environment: EZ-NBIST
芯測小學堂 iSTART Class
● 芯測小學堂第一集: BIST & BISR
● 芯測小學堂第二集: Testing Algorithms
● 芯測小學堂第三集: EZ-Debug
● 芯測小學堂第四集: iSTART-TEK Technical Service
● 芯測小學堂第五集: START & EZ-BIST
● 芯測小學堂第六集: Customer Testimonial – iTE
● 芯測小學堂第七集: Customer Testimonial – Rafael Micro
● 芯測小學堂第八集: Specific functions for Automotive and HPC
● 芯測小學堂第九集: Preview new products and functions: EZ-Safety & EZ-TEC