Automatic test equipment (ATE) is commonly used for SoC testing. The ATE then generates a log file of the testing results. When the ATE log file only consists of the signals 0 or 1, this log file is not easy to understand without using analysis tools. To simplify and expedite the analysis of ATE testing results for memories, the ATE diagnosis tool of STARTTM v3 is introduced. Along with the files generated by iSTART tools, it can easily analyze faulty memory information. iSTART has also developed a PC-based EZ-Debug, that can debug some chips after shuttle tape out or chips under development. This tool helps reduce ATE testing costs and obtain real-time diagnosis results.