Exclusively Provides the Optimized
Memory Test and Repair Solutions

SRAM Test and Repair Circuit Development Environment.

 

免費下載 eBook,掌握最新關鍵趨勢!

突破 AI 晶片效能的致命盲點:穩定運算正在取代極限算力

 

Design Solutions for Real-World Requirements

Delivering proven and verifiable ASIC and SoC design solutions
to address common customer-specific design challenges.

 

Quality Built for Sustainability

Built on the principles of high efficiency, low power consumption,
and small area, we establish long-term, reliable quality standards
through advanced memory testing and repair technologies.

 

iSTART News

Latest updates and announcements from iSTART-TEK.

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關於 芯測科技

芯測科技專注於EDA工具與IP,提供完整MBIST、MBISR及eFlash BIST解決方案,協助客戶在晶片開發與量產階段精準偵測、修復記憶體缺陷,提升良率、品質與可靠性。技術廣泛應用於車規、AI、HPC、網通及消費電子領域。公司擁有近30項專利,並通過ISO 9001、ISO 27001及ISO 26262 TCL1認證。其專利化架構打造的SRAM測試平台支援自訂演算法、MART AI演算法推薦,以及Repair、POT、UDA等功能,可滿足功能安全與FMEDA需求,協助客戶加速產品上市與ASIL認證。

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生態系統

透過平台式架構建立出完整的生態系統,整合晶片設計、設計服務、IP供應商、晶圓代工廠、封裝測試廠及雲端服務等生態合作夥伴,為客戶提供更全面的服務。

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