Recently, the global chip shortage has impacted the automotive chip market, resulting in a sharp increase in the production capacity demand of semiconductor-related manufacturers. iSTART-TEK pointed out that the current research and development focus for global automakers is how to produce safer, more comfortable and more convenient high-tech vehicles.
iSTART-TEK said that ISO26262 titled “Road Vehicles – Functional Safety” has strict specifications for the development of automotive chips. To meet the specifications, iSTART-TEK ‘s EDA tools, START™ v3 and EZ-BIST, can provide chip developers with comprehensive solutions.
The BIST and BISR + ECC (Error-Correcting Code) features (shown in Figure 1) in START™ v3 enable chip developers to detect the dies with memory defects through numerous testing algorithms, which can further help reduce DPPM. Moreover, through the ECC feature in EZ-BIST, the memory errors in the automotive chips during operation can be corrected, fully complying with the ISO26262 specifications.
Figure 1
The BIST and BISR + POT (Power_On Test) features are shown in Figure 2. When the range of memory defects in the automotive electronic chip is too large, the POT feature can perform a large-scale memory detection and repair, extending the automotive chip lifetime.
Figure 2
iSTART-TEK emphasizes that BIST and BISR of START™ v3 plus ECC or POT can meet the security specifications of ISO26262. In addition, START™ v3 also supports UDA, the user-defined memory test algorithm development platform, as shown in Figure 3. With UDA, chip developers can design customized test algorithms according to the chips’ properties, so as to reduce DPPM, increase yield, and improve driving safety.
Figure 3
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