High temperature cause memory errors
During memory testing, thermal noise generated by high temperatures can cause changes in memory bitcells, leading to signal inversion and thus errors.
Introduce of specific algorithm
iSTART-TEK employs a special algorithm combining Retention test, March C+ algorithm, and consecutive read/write operations, which can be created using UDA platform of iSTART-TEK. The Retention test is designed to identify DRF, or Data retention faults, which are soft errors occurring when a memory cell loses its stored logical value over time without being accessed. And consecutive read/write operations are designed for detection of the dynamic defect of FinFET process.
After diagnosing soft errors, how should they be repaired?
iSTART-TEK’s ECC solution can perform a series of repairs for soft errors. The ECC memory repair process generally involves error detection, determining the type of error, and correcting the error. ECC tools can ensure data accuracy in chips with high-security requirements.
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