What algorithms does iSTART-TEK have to detect the locations of these faults?
The algorithms at iSTART-TEK are configurable, meaning they can be customized and merged, ranging from the basic March algorithm to highly complex ones, like our extremely intricate algorithm Polaris. By integrating these with the Diagnosis function in our EDA tools, it becomes easy to locate the origins of these faults. While finding the location is important, what’s even better is, from which different wafers are collected, identifying which areas have more faults. This information can be fed back to the wafer fabrication plants, thereby improving the overall yield of the wafers.
What types of faults are there?
Here we introduce several common types of faults, such as SAF, which stands for Stuck-At-Fault. This means that the affected cell in this error will always remain at 0 or 1 and won’t be able to obtain any other values. Next is TF, which is a Transition-Induced Fault, indicating that this cell cannot undergo a transition. RDF is caused by a state change due to a Read operation, while DRDF is also caused by a state change due to a Read operation, but the read value remains correct. WDF occurs when the cell should undergo a transition but doesn’t. IRF occurs when there is no change in state during a Read operation, but the read value is incorrect. Additionally, there are NPSF, which are neighborhood pattern-sensitive faults, including ANPSF, where neighboring cells transitioning can affect the base cell.
DRF, which stands for Data Retention Fault in dynamic random access memory, is caused by very high resistive-open defects affecting the refresh loop of the core unit. Lower resistance values can also lead to DRFs that are difficult to detect. There are many other types of faults, such as Coupling Faults, SCFs, DCF, NPSF, SNPSF, ANPSF like this. If you want to learn more, you can contact the technical team at iSTART-TEK for further information.
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