As the global automotive industry moves towards electrification and intelligence, the demand for automotive SoCs has significantly increased due to continuous advancements in automotive electronic technology. According to “IC Insights”, the automotive SoC market is projected to account for 9.9% of the overall IC market value in 2026, with a compound annual growth rate of 13.4% expected from 2021 to 2026. It is anticipated to become the fastest-growing semiconductor application market, driven by the specification advancements in various ICs such as sensors and analog ICs. The growth momentum is also fueled by the continuous improvement of electric and energy vehicles.
To ensure the proper functioning of automotive electronic chips under various complex scenarios while ensuring driving and passenger safety, iSTART-TEK has developed the configurable eFlash IP testing and repair circuit development environment, EZ-NBIST (Non-Volatile Memory Built-In Self-Test). EZ-NBIST is a customized EDA tool for eFlash testing and repair circuit development, accessible through a user-friendly GUI (Graphical User Interface). It significantly reduces eFlash testing time and lowers testing costs.
The customized eFlash testing and repair IPs provided by iSTART-TEK is generated using their EDA tools, EZ-NBIST. Users can select their preferred test interface and eFlash size through EZ-NBIST. Based on the users’ configurations, EZ-NBIST automatically generates the testing and repair circuits for eFlash. Additionally, users can integrate the customized eFlash testing and repair IP into their SoCs.
The benefits of using customized eFlash testing and repair IPs are as follows:
- It can save time on learning how to use EDA tools.
- The configurable test options lead to cost reduction in eFlash testing.
iSTART-TEK’s EZ-NBIST has been adopted by Chinese semiconductor manufacturers for generating eFlash test and repair circuits. Additionally, the customized eFlash test and repair IPs have also been adopted by Chinese automotive SoC developers. Whether users choose EZ-NBIST or the customized eFlash test and repair IPs, they can configure the test options through a configurable interface, significantly reducing eFlash testing costs.
Using EDA tools or IPs has become an essential part of SoC design. iSTART-TEK’s EZ-NBIST and customized eFlash test and repair IPs can fully meet customers’ needs in saving chip testing costs, effectively reducing chip testing expenses, and enhancing chip competitiveness.
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