How to Detect Faults
iSTART-TEK offers a variety of memory testing algorithms, including the most basic March algorithm and highly complex algorithms like POLARIS. Combined with the diagnosis feature in iSTART-TEK’s EDA tools, it is easy to pinpoint the location of faults and provide immediate feedback to the wafer manufacturer, thereby improving the overall yield of wafers.
Types of Faults
● Stuck-At Fault (SAF)
● Transition Fault (TF)
● Read Disturb Fault (RDF)
● Deceptive Read Disturb Fault (DRDF)
● Write Disturb Fault (WDF)
● Incorrect Read Fault (IRF)
● Neighborhood Pattern Sensitive Fault (NPSF)
● Data Retention Fault (DRF)
● Coupling Fault (CF)
● State Coupling Faults (SCFs)
● Dynamic Coupling Fault (DCF)
● DCF, NPSF, SNPSF, ANPSF…