iStart ClassMultimedia LibraryNews&Events Episode 36: SRAM Testing Algorithm for Automotive-Grade Chips Part 3: Using UDA + TEC to Generate a Full-Coverage SRAM Defect Testing Algorithm https://youtu.be/_dIZhi6tVu0 With the continuous adoption of advanced semiconductor processes like FinFET and GAA, while chip…ZoeJune 30, 2025
iStart ClassMultimedia Library Episode 35: SRAM Testing Algorithm for Automotive-Grade Chips Part 2: Types of SRAM Failures in Automotive Chips https://youtu.be/PVoXi91fTj0 In automotive applications, SRAM plays a critical role as temporary storage and high-speed buffering.…ZoeJune 25, 2025
iStart ClassMultimedia Library Episode 34: SRAM Testing Algorithm for Automotive-Grade Chips Part 1: Overview of DPPM in Automotive Chips https://youtu.be/Mxjj72guAHs DPPM (Defective Parts Per Million) is a key metric for measuring the quality and…ZoeMay 28, 2025
iStart ClassMultimedia Library Episode 33: The Relationship Between Read/Write Operations of SRAM Testing Algorithms and SRAM Defect Types https://youtu.be/iLSeI6qahvs Operations and Faults Write operations mainly reveal stuck-at faults, write disturb faults, access faults,…ZoeMay 21, 2025
iStart ClassMultimedia Library Episode 32: START™ v5 Performance Enhancement Compared to START™ v3 https://youtu.be/MoVcx7B0__M START™ v5, iSTART-TEK’s new launched product, has significant improvements on RTL syntax identification, memory…ZoeApril 24, 2025
iStart ClassMultimedia Library Episode 31: iSTART-TEK Demonstrates Customers’ Successful Mass Production 1. Automotive Electronics Applications iSTART-TEK’s customers have successfully applied the EDA tool START (SRAM Testing…ZoeMarch 26, 2025
iStart ClassMultimedia Library Episode 30: Testing Elements Change (TEC) https://youtu.be/Z7YtY9kRxv0 The behavior of traditional algorithms cannot be modified after chip tape-out, which can lead…ZoeDecember 25, 2024
iStart ClassMultimedia Library Episode 29: Extend Chip Lifecycle with iSTART-TEK’s EZ-Monitor IP https://youtu.be/Tc_50NUdZlg Both defects caused during semiconductor manufacturing and abnormal leakage current due to aging can…ZoeNovember 29, 2024
iStart ClassMultimedia Library Episode 28: iSTART-TEK’s eFlash Testing and Repair IP are Widely applied in Automotive Electronic Chips https://youtu.be/DBUcoWGOOvY Development of automotive electronics The global automotive industry is moving toward electrification and smart…ZoeNovember 25, 2024