August 22: Easily ChangeSRAM Testing Algorithms After Mass Production Using IP
How can we efficiently test the important or large-area SRAM? Current algorithms waste unnecessary time testing less important SRAM simultaneously. That’s why we need EZ-TEC, a new-generation IP technology, to conduct focused testing, thereby reducing costs and enhancing yields.
Highlights:
• Who says IP can’t flexibly adjust test algorithms?
• iSTART-TEK EDA tools and IP support this feature
• Explore application scenarios and processes of EZ-TEC