About eFlash BIST IP
eFlash BIST provides test items that meet automotive electronic requirements, encompassing all the test items required by vendors. Due to eFlash has been using to store the initializing data of ROM, it will be important to cruise safety. All test items of eFlash BIST IP can be turned on and off individually. Additionally, it offers the ability to adjust time parameters on the machine, repair functions, and enhance the yield of the eFlash macro. It also provides a diagnostic feature, pass or fail of diagnosing of fault information, and offers a flexible interface, which is quite convenient for inputting test vectors into the machine.
The POT of the eFlash BIST IP
The POT (Power_On Test) so far of the eFlash BIST IP provides a life cycle test for eFlash after power-on, ensuring that eFlash can be used normally after each startup. The result of the diagnosis, like pass or fail, is indicated through MGO and the finishing of whole test or not will be indicated by MRD signal.
The advantages of the eFlash BIST IP
The eFlash BIST IP not only meets the test items of ISO 26262 for automotive electronics but also all the test items required by suppliers. All test items can be individually activated and deactivated, and it allows for the adjustment of time parameters on the machine, enhancing the yield of the eFlash macro. Additionally, it provides a diagnostic function that can quickly identify erroneous information; lastly, the eFlash BIST IP offers a flexible interface for easy input of test vectors into the machine.
Click the link below the video .Tell us your answer and if you answer correctly you will get a surprise gift: https://forms.office.com/r/P6HuGBdiYQ