Episode 33: The Relationship Between Read/Write Operations of SRAM Testing Algorithms and SRAM Defect Types

Operations and Faults

Write operations mainly reveal stuck-at faults, write disturb faults, access faults, and open faults.
Read operations mainly catch stuck-at faults during sensing, read disturb faults, deceptive read destructive faults, and retention faults.
And combined write-read sequences are used to find transition faults, dynamic faults, and marginal stability issues.

To perform the specific read and write operations mentioned above to detect a wide range of defects, iSTART-TEK’s TEC and UDA provide essential support for designing effective SRAM testing algorithms.
UDA is a configurable SRAM testing platform. It enables users to create specific SRAM testing algorithms by executing sequences of write and read operations, and it also supports all kinds of March tests.
TEC, on the other hand, offers flexibility even after CP stages. By using LEGO-based SRAM testing elements, TEC allows users to change and fine-tune testing algorithms whenever needed.