Products
Increase Yield Rate
ISO 26262 TCL1 Qualified
▍EDA Tools
- START: Memory test and repair circuit development environment
- EZ-BIST: Memory test circuit development environment with GUI
- EZ-NBIST: NVM Test and Repair Solution
- MART (MBIST Algorithm Recommendation Tool)
- UDA (User-Defined Algorithms)
- TEC (Testing Elements Change)
- NVM Sharing for Memory Repairing
▍IP
- EZ-TEC: Easy to change SRAM testing algorithms after CP phases
- EZ-Safety: Easy to finish SRAM repair and data backup
- EZ-Monitor: Easy to monitor lifecycle of SoC
- eFlash BIST: Implement all recommendation test items for high test coverage