With regard to memory testing and repair solutions, iSTART-TEK develops various functions that can be applied to the IC design process, enabling customers to obtain more advanced and efficient competitive advantage.
iSTART-TEK provides two main product line:
EZ-BIST & STARTTM v2
EZ-BIST features simple setting and easy to use, suitable for developing MCU system which memory instance is less than 50. EZ-BIST is also the best tool for academic and semiconductor research institutions to realize MBIST behavior and implementation. EZ-BIST's friendly interface and simplify operation enables users to build BIST circuit instantly, effectively shorten SoC development time, further improves product inspection and reduces development cost.
- START EDA tool series
- Customized design IP (Intellectual Property) series
STARTTM v2 (SoC's memory Testing And Repairing Technology) is a complete memory testing and repairing solution for generating BIST and BISR circuit and inserting them into customer's design automatically. STARTTM v2's friendly interface and menu style constructive configuration assists users to fulfill DFT for all kind of IC design simply.
Customized IP (eFlash Test and Repair、SRAM Test and Repair、Other Types of Memory Test and Repair)
For all memory storages, such as e-Flash, MTP, SRAM, MRAM...etc., iSTART can customize IP based on particular MBIST & MBISR design requirements. With accumulated patents and experiences in testing field, iSTART can accomplish MBIST & MBISR according to customers requirements and offer corresponding IPs to customers instantly. By means of iSTART's professional technology service, customers can significantly improve their product quality and yield rate.