簡易版記憶體測試電路開發環境
產品特色
- Memory BIST insertion up to 30 instances
- Top-down flow
- Bottom-up flow
- Complete GUI interface
- Supports UDM (User Defined Memory)
- Supports memory grouping settings
- Supports auto-clock tracing
- Smart error proofing design
- Multiple memory testing algorithms
- Supports testing algorithms selection by application & technology nodes
應用
- MCU
- IoT
- Fingerprint recognition
- Wireless
測試介面
- JTAG