iReport-2024-Vol.1.2专刊，让您可迅速获取 iSTART-TEK的最新技术与活动讯息。
全文请点选“详细内容”
专利Patent
● 芯测科技「METHOD FOR GENERATINGAN MEMORY BUILT-IN SELF-TEST ALGORITHM CIRCUIT」成功取得美国专利证书
新闻News
● 芯测科技(上海芯复瑞)客制化EDA工具结合云端与AI抢攻车用电子商机
技术文章White Paper
● Highly configurable RRAM IP testing and repairing circuits development environment: EZ-NBIST
芯测小学堂 iSTART Class
● 芯测小学堂第一集: BIST & BISR
● 芯测小学堂第二集: Testing Algorithms
● 芯测小学堂第三集: EZ-Debug
● 芯测小学堂第四集: iSTART-TEK Technical Service
● 芯测小学堂第五集: START & EZ-BIST
● 芯测小学堂第六集: Customer Testimonial – iTE
● 芯测小学堂第七集: Customer Testimonial – Rafael Micro
● 芯测小学堂第八集: Specific functions for Automotive and HPC
● 芯测小学堂第九集: Preview new products and functions: EZ-Safety & EZ-TEC