EZ-NBIST
NVM Test and Repair Solution
The NVM configurable testing and repairing platform features multiple NVM IP models, such as eFlash, OTP, MTP, RRAM. This platform can be utilized in applications that incorporate NVM IP. EZ-NBIST accelerates the time required to complete the designs of testing and repair electric circuit. In addition, it provides customers with high efficiency testing and repair solutions, particularly for supporting advanced testing algorithms for RRAM.
Features
- Support generating ATE STIL/WGL format
- Implement all recommendation test items for high test coverage
- All test item can be configurable
- Timing parameters can be adjusted
- Provide users with repairing mode to increase yield
- Diagnosis mode
Applications
- Automotive
- Security
- White goods
- MCU
- IoT
- Smartcards
- Wearables
- Gaming
Interface
- JTAG
- IEEE 1149.7
- SPI