Exclusively Provides the Optimized
Memory Test and Repair Solutions

SRAM Test and Repair Circuit Development Environment.

 

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突破 AI 芯片效能的致命盲点:稳定运算正在取代极限算力

 

Design Solutions for Real-World Requirements

Delivering proven and verifiable ASIC and SoC design solutions
to address common customer-specific design challenges.

 

Quality Built for Sustainability

Built on the principles of high efficiency, low power consumption,
and small area, we establish long-term, reliable quality standards
through advanced memory testing and repair technologies.

 

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Latest updates and announcements from iSTART-TEK.

 

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关于 芯测科技

芯测科技专注于EDA工具与IP,提供完整MBIST、MBISR及eFlash BIST解决方案,协助客户在芯片开发与量产阶段精准侦测、修复内存缺陷,提升良率、质量与可靠性。技术广泛应用于车规、AI、HPC、网通及消费电子领域。公司拥有近30项专利,并通过ISO 9001、ISO 27001及ISO 26262 TCL1认证。其专利化架构打造的SRAM测试平台支持自定义算法、MART AI算法推荐,以及Repair、POT、UDA等功能,可满足功能安全与FMEDA需求,协助客户加速产品上市与ASIL认证。

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生态系统

透过平台式架构建立出完整的生态系统,整合芯片设计、设计服务、IP供应商、晶圆代工厂、封装测试厂及云端服务等生态合作伙伴,为客户提供更全面的服务。

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