DPPM

EZ-BIST is a custmized EDA tool that contains a variety of built-in memory testing algorithms. Through the graphical user interface (GUI), users can easily design memory circuits using suitable algorithms.

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EZ-TEC can coexist with the existing memory testing circuits of chip design companies. This U. S. patent breaks down memory testing algorithms into elements, allowing users to reconstruct the architecture of any memory testing algorithm through element reorganization.

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