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芯測科技股份有限公司
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Reduce Memory Testing Cost & Increase Chip Yield Rate
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EZ-BIST
EZ-BIST features simple setting and easy to use, suitable for developing MCU system which memory instance is less than 50. EZ-BIST is also the best tool for academic and semiconductor research institutions to realize MBIST behavior and implementation. EZ-BIST's friendly interface and simplify operation enables users to build BIST circuit instantly, effectively shorten SoC development time, further improves product inspection and reduces development cost.
Feature
- Complete GUI interface
- Support UDM (User Defined Memory)
- Support memory grouping setting
- Support auto clock tracing
- Support clicks and drags to memory port insertion
- Support gate-cell insertion for power saving
- Smart error proofing design
- Memory BIST insertion up to 50 instances
- Multiple memory testing algorithms
- Support testing algorithms selection by application & technology node
Application
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MCU
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IoT
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White Goods
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Medical equipment
Testing Interface
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JTAG
