As the COVID-19 pandemic continues to affect the world, iSTART-TEK is playing its part by providing cloud memory testing solutions to customers in the global semiconductor industry.
iSTART-TEK’s EZ-BIST-Cloud is a memory testing tool designed for cloud services. It features a user-friendly GUI (Graphical User Interface) operation mode, reducing the chances of human errors and simplifying the learning process for new users.
iSTART-TEK stated that the advancement in manufacturing processes has led to an increase in the demand for memory testing among IC design companies that develop IoT-related chips. Many MCU IC design companies are incorporating memory testing circuits in their products to ensure the product yields. Due to the increasing specialization in the IC design and development process,, many IC design companies require more specialized EDA tools for memory testing. To address the cost and yield concerns of companies that design MCU ICs,, iSTART-TEK has developed a testing method specially for these companies. After subscribing to iSTART-TEK’s EZ-BIST-Cloud, users can access the system through the cloud to perform memory testing circuit design.
iSTART-TEK launched the first version of EZ-BIST-Cloud on the cloud platform in the third quarter of this year, providing customers with fast and convenient EDA cloud services. With the help of EZ-BIST-Cloud, not only can the productivity of EDA products be optimized, but also their sales markets can be rapidly expanded.
Furthermore, iSTART-TEK also mentioned that in the future, customers will be able to directly create memory testing circuits through iSTART-TEK’s EDA Clouding service. In addition to improving cost-effectiveness and flexibility, this will speed up the design process and reduce product development time, thus enabling teams from different regions to collaborate, and helping IC design companies to shorten their product launch schedules. In short, iSTART-TEK’s EDA Clouding service provides a cost-effective, fast and comprehensive solution for IC design companies during the development of memory testing circuits.